With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

техническая литература

технические науки

электроника

ESD Testing. From Components to Systems

ESD. Circuits and Devices

Electrical Overstress (EOS). Devices, Circuits and Systems

ESD. Analog Circuits and Design

ESD: Design and Synthesis

ESD Basics. From Semiconductor Manufacturing to Product Use

Latchup

любовные романы

фэнтези

учебная и научная литература

современная русская литература

современные любовные романы

современная зарубежная литература

детективы

об истории серьезно

приключения

книги о приключениях

ужасы / мистика

учебники и пособия для вузов

cтихи, поэзия

книги по психологии

стихи и поэзия

гуманитарные и общественные науки

русская классика

мистика

боевики, остросюжетная литература

публицистическая литература

любовное фэнтези

биографии и мемуары

эротика и секс

современные детективы

короткие любовные романы

сказки

попаданцы

литература 19 века

научная фантастика

юмористическая литература

ESD Testing. From Components to Systems

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